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fig2b_metadata.xlsx
عنوان الموقع URL: https://datahub.h2awsm.org/dataset/146a4b60-86f2-49d7-9bb9-62fbd821575e/resource/a1c3d287-a849-4ea2-9722-7e56fc21720c/download/fig2b_metadata.xlsx
Metadata for as-received photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN using a commercial AFM system (Bruker Dimension Icon). PeakForce TUNA mode was used to acquire the morphology and current simultaneously. A PtIr conductive probe with spring constant of 2.8 Nm-1 was used for the scanning. A white light source was used to illuminate the surface during the acquisition. Line scan extracting the topography and photocurrent from a as-received Si/GaN sample. The topography mapping is 2 × 2 µm2. The sample bias was 0.4V and this photoconductive AFM measurement was performed under white light front illumination with an angle.
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Resource Metadata
| data source | LBL PEC Stand 1 |
|---|---|
| lab environment | Indoor Lab |
| measurement | Biased |
| measurement type other | AFM |
| metadata modified | قبل 5 سنوات |
| mimetype | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
| size | 9.9 كيلوبايت |
| آخر تحديث | 3 فبراير 2021 |
|---|---|
| أنشئت | 3 فبراير 2021 |
| تنسيق | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
| الترخيص | لم يتم تزويد أية رخصة |