Formats: XLSX JSON Data Source Type: Lab Experimental Capability Node: LBNL PEC In-Situ and Operando Nanoscale Characterization Tags: GaN

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  • fig1c

    11 Resources
    Intermittent chronoamperometry (CA) testing was performed on Si/GaN photocathode in hourly manner. The LSV scan at 0 hour, 1 hour CA, 2 hours CA, 3 hours CA, 4 hours CA, 6 hours...
  • fig2b

    5 Resources
    Photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current...
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