Formats: XLSX Tags: durability Capability Node: LBNL PEC Device In-Situ and Operando Testing

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  • fig1c

    11 Resources
    Intermittent chronoamperometry (CA) testing was performed on Si/GaN photocathode in hourly manner. The LSV scan at 0 hour, 1 hour CA, 2 hours CA, 3 hours CA, 4 hours CA, 6 hours...
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