Tags: GaN Technology Type: PEC Measurement Types: Other Formats: JPEG Capability Node: LBNL PEC In-Situ and Operando Nanoscale Characterization

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  • fig2b

    5 Resources
    Photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current...
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