Capability Node: LBNL PEC Device In-Situ and Operando Testing Measurement Types: Other Technology Type: PEC

Filter Results

  • fig2b

    5 Resources
    Photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current...
You can also access this registry using the API (see API Docs).