Форматууд: JSON Measurement Types: Other

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  • fig2b

    5 Resources
    Photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current...
Та API -ийг ашиглан бүртгүүлж болно (API бичиг баримтууд -ээс харна уу).