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fig2b_raw_data.xlsx
Photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples before (as-received, AR) and after 10 hrs CA testing (modified surface, MS) using a commercial AFM system (Bruker Dimension Icon). PeakForce TUNA mode was used to acquire the morphology and current simultaneously. A PtIr conductive probe with spring constant of 2.8 Nm-1 was used for the scanning. A white light source was used to illuminate the surface during the acquisition. Line scan extracting the topography and photocurrent from a as-received Si/GaN sample. The topography mapping is 2 × 2 µm2. The sample bias was 0.4V and this photoconductive AFM measurement was performed under white light front illumination with an angle.
Resource Metadata
| data source | LBL PEC Stand 1 |
|---|---|
| data tool | Multi-spectra |
| lab environment | Indoor Lab |
| measurement | Biased |
| measurement type other | Atomic force microscopy (AFM) |
| metadata modified | 5 жилийн өмнө |
| mimetype | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
| size | 22.4 килобайт |
| Сүүлд шинэчлэгдсэн | 2021.02.03 |
|---|---|
| Үүссэн | 2021.02.03 |
| Хэлбэр | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
| Ашиглах зөвшөөрөл | Ямар ч лиценз өгөгдөөгүй |