Gå til innhold
Public data is available without account registration. Please register if you require access to private research findings.
Logg inn
Registrer
NOTICE:
This site works best in Chrome, Safari, and Firefox. Versions of Internet Explorer may not work correctly.
Hjem
Projects
Data
Om
Help
Hjem
Datasett
Sorter etter
Relevans
Navn stigende alfabetisk
Navn synkende alfabetisk
Sist endret
Velg
Measurement Types:
Other
Filterresultater
fig2b
5 Resources
Photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current...
XLSX
JSON
JPEG
Du får også tilgang til dette registeret med
API
(se
API-dokumenter
).
} }
