Photoelectrochemically Self-Improving Si/GaN Photocathode - Datasets
Project ID | eccb7743-4859-46df-b8d5-de83bfa6d494 |
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fig2b
5 ResourcesPhotoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current...