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fig1c
11 ResourcesIntermittent chronoamperometry (CA) testing was performed on Si/GaN photocathode in hourly manner. The LSV scan at 0 hour, 1 hour CA, 2 hours CA, 3 hours CA, 4 hours CA, 6 hours... -
fig2b
5 ResourcesPhotoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current...
คุณสามารถเข้าถึงคลังทาง API (ให้ดู คู่มือ API).