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fig2b_metadata.xlsx
Metadata for as-received photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN using a commercial AFM system (Bruker Dimension Icon). PeakForce TUNA mode was used to acquire the morphology and current simultaneously. A PtIr conductive probe with spring constant of 2.8 Nm-1 was used for the scanning. A white light source was used to illuminate the surface during the acquisition. Line scan extracting the topography and photocurrent from a as-received Si/GaN sample. The topography mapping is 2 × 2 µm2. The sample bias was 0.4V and this photoconductive AFM measurement was performed under white light front illumination with an angle.
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Resource Metadata
| data source | LBL PEC Stand 1 |
|---|---|
| lab environment | Indoor Lab |
| measurement | Biased |
| measurement type other | AFM |
| metadata modified | 5年前 |
| mimetype | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
| size | 9.9 KiB |
| 最后更新 | 2021年2月3日 |
|---|---|
| 创建的 | 2021年2月3日 |
| 格式 | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
| 授权 | 没有指定授权 |