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fig2d_raw_data.xlsx
Line scan extracting the topography and photocurrent from a 10 hours chronoamperometry (CA) tested Si/GaN sample. The sample bias was 0V and this photoconductive AFM measurement was performed under white light front illumination with an angle.
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Resource Metadata
data source | LBL PEC Stand 1 |
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data tool | Multi-spectra |
lab environment | Indoor Lab |
measurement | Unbiased |
measurement type other | Atomic force microscopy (AFM) |
metadata modified | 4 年前 |
mimetype | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
size | 23 KiB |
最後更新 | 2021年2月3日 |
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建立 | 2021年1月30日 |
格式 | application/vnd.openxmlformats-officedocument.spreadsheetml.sheet |
授權 | 沒有可使用的許可 |