10 hours chronoamperometry (CA) testing under 1 sun illumination and constant bias at -0.6 V vs RHE, the corresponding Faradaic efficiency reveals a self-improving nature of GaN, inset: CA testing on bare Si for 5 hours under 1 sun illumination and -0.6 V vs RHE, this bare Si photocathode rapidly drops down to < 0.05 mA/cm2 within an hour. Both CA testing performed in 0.5 M H2SO4 (pH=0.4).
Dataset Metadata
Author |
Francesca M. Toma
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Maintainer Email |
fmtoma@lbl.gov
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DOI |
10.17025/1764126
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Institution |
Lawrence Berkeley National Laboratory
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Capability Node |
LBNL PEC Device In-Situ and Operando Testing
LBNL Probing and Mitigating Corrosion
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Technology Type |
PEC
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Data Source Type |
Lab Experimental
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Sample Barcode |
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Sample Name |
Si/GaN photocathode (GaN thin film protected Si solar cell)
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Collection Date |
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Comments |
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Measurement Types |
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Measurement Type Other |
None
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Additional Info
Author |
Francesca M. Toma
|
Updated |
February 9, 2021, 15:32 (UTC)
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Created |
February 3, 2021, 20:04 (UTC)
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