Accelerated CA testing on bare epilayer Si/GaN photocathode at constant bias of -0.6 V vs RHE under 3.5 sun illumination for 150 hours in 0.5 M H2SO4 (pH=0.4)

Dataset Metadata

Author Francesca M. Toma
Maintainer Email fmtoma@lbl.gov
DOI 10.17025/1764127
Institution Lawrence Berkeley National Laboratory
Capability Node LBNL PEC Device In-Situ and Operando Testing
LBNL PEC In-Situ and Operando Nanoscale Characterization
LBNL Probing and Mitigating Corrosion
Technology Type PEC
Data Source Type Lab Experimental
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Sample Name
Collection Date
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Measurement Types
Measurement Type Other None

Additional Info

Author Francesca M. Toma
Updated February 5, 2021, 19:30 (UTC)
Created February 3, 2021, 22:55 (UTC)