fig2b - Metadata
| Project ID | eccb7743-4859-46df-b8d5-de83bfa6d494 |
|---|---|
| Dataset ID | 146a4b60-86f2-49d7-9bb9-62fbd821575e |
Photoconductive atomic force microscopy (PC-AFM) measurements were conducted on Si/GaN samples. PeakForce TUNA mode was used to acquire the morphology and current simultaneously. A PtIr conductive probe with spring constant of 2.8 Nm-1 was used for the scanning. A white light source was used to illuminate the surface during the acquisition. Line scan extracting the topography and photocurrent from a as-received Si/GaN sample. The topography mapping is 2 × 2 µm2. The sample bias was 0.4V and this photoconductive AFM measurement was performed under white light front illumination with an angle.
Dataset Metadata
| Author | Francesca M. Toma |
|---|---|
| Maintainer Email | fmtoma@lbl.gov |
| DOI | 10.17025/1764154 |
| Institution |
Lawrence Berkeley National Laboratory |
| Capability Node |
LBNL PEC Device In-Situ and Operando Testing LBNL PEC In-Situ and Operando Nanoscale Characterization LBNL Probing and Mitigating Corrosion |
| Technology Type |
PEC |
| Data Source Type |
Lab Experimental |
| Sample Barcode | |
| Sample Name | |
| Collection Date | |
| Comments | |
| Measurement Types |
Other |
| Measurement Type Other | None |
Additional Info
| Author | Francesca M. Toma |
|---|---|
| Updated | February 5, 2021, 19:27 (UTC) |
| Created | February 3, 2021, 23:47 (UTC) |